US Patent Issued to Tokyo Electron on Oct. 27 for "Connection assembly and inspection device" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,775,023, issued on Oct. 27, was assigned to Tokyo Electron Ltd. (Tokyo).

"Connection assembly and inspection device" was invented by Hidesumi Moriya (Yamanashi, Japan) and Hiroaki Hayashi (Yamanashi, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The connection assembly includes an intermediate connection member and a connection substrate stacked on the intermediate connection member. The intermediate connection member includes a plurality of connection pins electrically connecting a plurality of tester-side terminals and a plurality of probe card-side terminals, respectively, a first frame portion holding one end of each of the plurality of conne...