ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,227, issued on May 12, was assigned to NXP B.V. (Eindhoven, Netherlands). "Method of processing radar data" was invented by Jeroen Overdeves... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,228, issued on May 12, was assigned to APTIV TECHNOLOGIES AG (Schaffhausen, Switzerland). "Radar system for automotive applications" was inv... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,229, issued on May 12, was assigned to KOHERENT OY (Vantaa, Finland). "Method and arrangement for evaluating a distance between at least two... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,230, issued on May 12, was assigned to NXP B.V. (Eindhoven, Netherlands). "Signal processing for OFDM radar systems" was invented by Wilhelm... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,231, issued on May 12, was assigned to BAE Systems Information and Electronic Systems Integration Inc. (Nashua, N.H.). "Reduced latency look... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,232, issued on May 12, was assigned to Magna Electronics Inc. (Auburn Hills, Mich.). "Calibration process for vehicular radar sensing system... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,233, issued on May 12, was assigned to General Radar Corp. (Belmont, Calif.). "Measurement of electromagnetic spectral properties" was inven... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,234, issued on May 12, was assigned to Israel Aerospace Industries Ltd. (Lod, Israel). "Navigation system and method with continuously updat... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,235, issued on May 12, was assigned to IRIDESENSE (Issy-les-Moulineux, France). "Multispectral LiDAR comprising a spectral delay unit" was i... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,236, issued on May 12, was assigned to NUVOTON TECHNOLOGY CORPORATION JAPAN (Kyoto, Japan). "Imaging apparatus and variation information cal... Read More