ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,233, issued on May 12, was assigned to General Radar Corp. (Belmont, Calif.).

"Measurement of electromagnetic spectral properties" was invented by Jon Williams (San Francisco).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed are methods, systems, and computer-readable medium to perform operations to classifying airfield debris. The operations include generating a series of frequency-modulated chirps having respective frequencies across a frequency range and directed toward a location of an object in an airfield. The operations can include receiving a series of reflections corresponding to a plurality of frequency-modulated chirps in the series...