ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,751, issued on April 14, was assigned to Intel Corp. (Santa Clara, Calif.). "Sample distribution-informed denoising and rendering" was inv... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,752, issued on April 14, was assigned to GENESYS LOGIC INC. (New Taipei City, Taiwan). "Image processing method and image processing appar... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,753, issued on April 14, was assigned to FUJIFILM Corp. (Tokyo). "Ultrasound image processing apparatus" was invented by Misaki Maruyama (... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,754, issued on April 14, was assigned to Rensselaer Polytechnic Institute (Troy, N.Y.). "Dynamic imaging and motion artifact reduction thr... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,755, issued on April 14, was assigned to Adobe Inc. (San Jose, Calif.). "Deep learning-based high resolution image inpainting" was invente... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,756, issued on April 14, was assigned to Carl Zeiss X-ray Microscopy Inc. (Dublin, Calif.). "Method and system for analytical x-ray calibr... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,757, issued on April 14, was assigned to DeLaval Holding AB (Tumba, Sweden). "System and computer-implemented method for image data qualit... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,758, issued on April 14, was assigned to UT-Battelle LLC (Oak Ridge, Tenn.). "Building leakage detector using reference-free background or... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,759, issued on April 14, was assigned to Advanced Micro Devices Inc. (Santa Clara, Calif.) and ATI TECHNOLOGIES ULC (Markham, Canada). "Ve... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,760, issued on April 14, was assigned to HYUNDAI MOBIS Co. LTD. (Seoul, South Korea). "Method and apparatus for detecting defect based on ... Read More