US Patent Issued to Carl Zeiss X-ray Microscopy on April 14 for "Method and system for analytical x-ray calibration, reconstruction and indexing using simulation" (California Inventor)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,756, issued on April 14, was assigned to Carl Zeiss X-ray Microscopy Inc. (Dublin, Calif.).

"Method and system for analytical x-ray calibration, reconstruction and indexing using simulation" was invented by Matthew Andrew (Livermore, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A mineral characterization method for an x-ray CT system comprises generating one or more volume datasets of a sample and identifying phases in the sample by correcting the datasets based on simulations. This can be employed with a polychromatic x-ray simulation and a highly controlled and well scaled implementation of analytical reconstruction to index materials of...