ALEXANDRIA, Va., Feb. 11 -- United States Patent no. D1,112,833, issued on Feb. 10, was assigned to House of Forgings LLC (Houston). "Baluster" was invented by Justin James Palazzo (Houston). The pa... और पढ़ें
ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,547,685, issued on Feb. 10, was assigned to Goodman Manufacturing Co. LP (Waller, Texas). "HVAC authentication system and method" was invented ... और पढ़ें
ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,544,900, issued on Feb. 10, was assigned to Nanjing Chervon Industry Co. Ltd. (Nanjing, China). "Power tool" was invented by Qingqing Pei (Nanj... और पढ़ें
ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,546,141, issued on Feb. 10, was assigned to B/E Aerospace Inc. (Winston-Salem, N.C.). "Magnetic door latch assembly" was invented by Joseph M. ... और पढ़ें
ALEXANDRIA, Va., Feb. 11 -- United States Patent no. D1,111,930, issued on Feb. 10, was assigned to Rivian IP Holdings LLC (Plymouth, Mich.) and Amazon Technologies Inc. (Seattle). "Vehicle door" was... और पढ़ें
ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,545,248, issued on Feb. 10. "Automatic collision-avoidance and/or harm-minimization of vehicle collisions" was invented by David E. Newman (Pow... और पढ़ें
ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,549,970, issued on Feb. 10, was assigned to CHUNG ANG University Industry Academic Cooperation Foundation (Seoul, South Korea). "System and met... और पढ़ें
ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,546,610, issued on Feb. 10, was assigned to Samsara Inc. (San Francisco). "Low-bridge detection by road segment" was invented by Bartosz Bojaro... और पढ़ें
ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,546,247, issued on Feb. 10, was assigned to VOLVO TRUCK Corp. (Gothenburg, Sweden). "Internal combustion engine arrangement" was invented by Jo... और पढ़ें
ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,546,810, issued on Feb. 10, was assigned to Shanghai Huali Integrated Circuit Corp. (Shanghai). "Test method for improving IO device yield" was... और पढ़ें