ALEXANDRIA, Va., July 28 -- United States Patent no. 12,694,540, issued on July 28, was assigned to THE HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY (Hong Kong). "Joint count and flow analysis for ... Read More
ALEXANDRIA, Va., July 28 -- United States Patent no. 12,694,541, issued on July 28, was assigned to Stryker Corp. (Portage, Mich.). "Tracking surgical items with prediction of duplicate imaging of it... Read More
ALEXANDRIA, Va., July 28 -- United States Patent no. 12,694,542, issued on July 28, was assigned to SCREEN Holdings Co. Ltd. (Kyoto, Japan). "Mark detection method and computer program" was invented ... Read More
ALEXANDRIA, Va., July 28 -- United States Patent no. 12,694,543, issued on July 28, was assigned to SUZHOU PULSE RONGYING MEDICAL TECHNOLOGY Co. LTD (Suzhou, China). "Method and apparatus for registe... Read More
ALEXANDRIA, Va., July 28 -- United States Patent no. 12,694,544, issued on July 28, was assigned to SONY GROUP Corp. (Tokyo). "Image processing device, image processing method, and surgical microscop... Read More
ALEXANDRIA, Va., July 28 -- United States Patent no. 12,694,545, issued on July 28, was assigned to Microsoft Technology Licensing LLC (Redmond, Wash.). "Encoding irregular shapes using angle-based c... Read More
ALEXANDRIA, Va., July 28 -- United States Patent no. 12,694,546, issued on July 28, was assigned to Continental Autonomous Mobility Germany GmbH (Ingolstadt, Germany). "Method and system for correcti... Read More
ALEXANDRIA, Va., July 28 -- United States Patent no. 12,694,547, issued on July 28, was assigned to OMRON Corp. (Kyoto, Japan). "Output control device, distance measuring device comprising the same, ... Read More
ALEXANDRIA, Va., July 28 -- United States Patent no. 12,694,548, issued on July 28, was assigned to Texas Instruments Inc. (Dallas). "Structured light projector" was invented by Srikanth Gurrapu (Fri... Read More
ALEXANDRIA, Va., July 28 -- United States Patent no. 12,694,549, issued on July 28, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Depth estimation using variant features" was... Read More