US Patent Issued to SAMSUNG ELECTRONICS on July 28 for "Depth estimation using variant features" (Illinois, California Inventors)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,694,549, issued on July 28, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).

"Depth estimation using variant features" was invented by Akash Mittal (Champaign, Ill.), Brian Harms (San Jose, Calif.) and Nigel Clarke (Sunnyvale, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "In one embodiment, an apparatus includes accessing an image, captured by a first camera, of an object that includes a size-invariant feature and a size-variant feature and determining a size of the size-invariant feature in the image. The method further includes determining, based on the determined size of the size-invariant feature in the image, a distance...