ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,743,753, issued on Sept. 22, was assigned to Verily Health Inc. (Dallas). "Masking model for visualizing uncertainty in image-to-image reconst... Read More
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,743,754, issued on Sept. 22, was assigned to BEIJING ZITIAO NETWORK TECHNOLOGY Co. LTD. (Beijing). "Video processing method and apparatus, ele... Read More
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,743,755, issued on Sept. 22, was assigned to GOOGLE LLC (Mountain View, Calif.). "Guided contextual attention map for inpainting tasks" was in... Read More
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,743,756, issued on Sept. 22, was assigned to InterDigital CE Patent Holdings SAS (Paris). "Inverse tone mapping with adaptive bright-spot atte... Read More
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,743,757, issued on Sept. 22, was assigned to VERISILICON MICROELECTRONICS (SHANGHAI) Co. LTD. (Shanghai) and VERISILICON MICROELECTRONICS (CHEN... Read More
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,743,759, issued on Sept. 22, was assigned to Jumio Corp. (Sunnyvale, Calif.). "Multiple fraud type detection system and methods" was invented ... Read More
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,743,761, issued on Sept. 22, was assigned to Schlumberger Technology Corp. (Sugar Land, Texas). "Collaborative generation of cuttings logs via... Read More
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,743,763, issued on Sept. 22, was assigned to AKTIEBOLAGET SKF (Gothenburg, Sweden) and SKF Aerospace France S.A.S (Montigny-le-Bretonneux, Fran... Read More
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,743,764, issued on Sept. 22, was assigned to Hyundai Motor Co. (Seoul, South Korea) and Kia Corp. (Seoul, South Korea). "Apparatus and method ... Read More
ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,743,765, issued on Sept. 22, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Classification of defect patterns of substrates" w... Read More