US Patent Issued to University of Central Florida Research Foundation on May 12 for "Spectrometer with rotated volume Bragg grating" (Florida Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,067, issued on May 12, was assigned to University of Central Florida Research Foundation Inc. (Orlando, Fla.). "Spectrometer with rotated vo... और पढ़ें

US Patent Issued to SEIKO EPSON on May 12 for "Optical device, spectroscopic device, and spectroscopic method" (Japanese Inventor)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,068, issued on May 12, was assigned to SEIKO EPSON Corp. (Japan). "Optical device, spectroscopic device, and spectroscopic method" was inven... और पढ़ें

US Patent Issued to Konica Minolta on May 12 for "Gas concentration measuring device, gas concentration measuring method, and program" (Japanese Inventor)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,069, issued on May 12, was assigned to Konica Minolta Inc. (Tokyo). "Gas concentration measuring device, gas concentration measuring method,... और पढ़ें

US Patent Issued on May 12 for "Method for quality inspection of etching paste material based on spectral response difference" (Chinese Inventor)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,070, issued on May 12. "Method for quality inspection of etching paste material based on spectral response difference" was invented by Zijin... और पढ़ें

US Patent Issued to ADVANTEST on May 12 for "Electromagnetic wave measuring apparatus, method, and recording medium" (Japanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,071, issued on May 12, was assigned to ADVANTEST Corp. (Tokyo). "Electromagnetic wave measuring apparatus, method, and recording medium" was... और पढ़ें

US Patent Issued to DAIKIN INDUSTRIES on May 12 for "Method for inspecting shaped product, and method for manufacturing shaped product" (Japanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,072, issued on May 12, was assigned to DAIKIN INDUSTRIES LTD. (Osaka, Japan). "Method for inspecting shaped product, and method for manufact... और पढ़ें

US Patent Issued to ARIZONA BOARD OF REGENTS ON BEHALF OF ARIZONA STATE UNIVERSITY on May 12 for "Method for characterizing melting transition and crystallization in a semicrystalline polymer" (Arizona Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,073, issued on May 12, was assigned to ARIZONA BOARD OF REGENTS ON BEHALF OF ARIZONA STATE UNIVERSITY (Scottsdale, Ariz.). "Method for chara... और पढ़ें

US Patent Issued to HAMAMATSU PHOTONICS on May 12 for "Time measurement device, fluorescence lifetime measurement device, and time measurement method" (Japanese Inventor)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,074, issued on May 12, was assigned to HAMAMATSU PHOTONICS K.K. (Hamamatsu, Japan). "Time measurement device, fluorescence lifetime measurem... और पढ़ें

US Patent Issued to SEEGENE on May 12 for "Light detection module and apparatus for detecting target analyte comprising the same" (Rhode Island, New York, Massachusetts Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,075, issued on May 12, was assigned to SEEGENE INC. (Seoul, South Korea). "Light detection module and apparatus for detecting target analyte... और पढ़ें

US Patent Issued to Bio-Rad Laboratories on May 12 for "Fluorescence detection system" (California Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,076, issued on May 12, was assigned to Bio-Rad Laboratories Inc. (Hercules, Calif.). "Fluorescence detection system" was invented by Evan Th... और पढ़ें

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