US Patent Issued to EBARA on June 16 for "Output signal processing device for eddy-current sensor" (Japanese Inventor)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,656,097, issued on June 16, was assigned to EBARA Corp. (Tokyo). "Output signal processing device for eddy-current sensor" was invented by Kats... Read More

US Patent Issued to GM GLOBAL TECHNOLOGY OPERATIONS, IOWA STATE UNIVERSITY RESEARCH FOUNDATION on June 16 for "Through-transmission eddy current system for inline inspection of power source electrodes" (Michigan, Virginia Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,656,098, issued on June 16, was assigned to GM GLOBAL TECHNOLOGY OPERATIONS LLC (Detroit) and IOWA STATE UNIVERSITY RESEARCH FOUNDATION INC. (Am... Read More

US Patent Issued to GM GLOBAL TECHNOLOGY OPERATIONS on June 16 for "Magnetic force dilatometer with temperature compensation" (Michigan Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,656,099, issued on June 16, was assigned to GM GLOBAL TECHNOLOGY OPERATIONS LLC (Detroit). "Magnetic force dilatometer with temperature compens... Read More

US Patent Issued to TOKYO SEIMITSU on June 16 for "Adjustment method for shape measuring device" (Japanese Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,656,100, issued on June 16, was assigned to TOKYO SEIMITSU Co. LTD. (Tokyo). "Adjustment method for shape measuring device" was invented by Yos... Read More

US Patent Issued to HAMAMATSU PHOTONICS on June 16 for "Spatial light modulation device, processing device, and position estimation method" (Japanese Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,656,101, issued on June 16, was assigned to HAMAMATSU PHOTONICS K.K. (Hamamatsu, Japan). "Spatial light modulation device, processing device, a... Read More

US Patent Issued to PRATT & WHITNEY CANADA on June 16 for "System and method for geometric transformation of a dimensional inspection" (Canadian Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,656,102, issued on June 16, was assigned to PRATT & WHITNEY CANADA CORP. (Longueuil, Canada). "System and method for geometric transformation o... Read More

US Patent Issued to SAMSUNG DISPLAY on June 16 for "Plurality layer thickness measuring device and method with fast fourier transform" (South Korean Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,656,103, issued on June 16, was assigned to SAMSUNG DISPLAY Co. LTD. (Yongin-si, South Korea). "Plurality layer thickness measuring device and ... Read More

US Patent Issued to LG Chem on June 16 for "Coating thickness measuring apparatus and method" (South Korean Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,656,104, issued on June 16, was assigned to LG Chem Ltd. (Seoul, South Korea). "Coating thickness measuring apparatus and method" was invented ... Read More

US Patent Issued to The Shape Sensing on June 16 for "Birefringence mitigation in an optical network" (Texas Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,656,105, issued on June 16, was assigned to The Shape Sensing Co. (Austin, Texas). "Birefringence mitigation in an optical network" was invente... Read More

US Patent Issued to Huazhong University of Science and Technology on June 16 for "Method and apparatus for measuring inner surface and transition curved surface contour of micropore" (Chinese Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,656,106, issued on June 16, was assigned to Huazhong University of Science and Technology (Wuhan City, China). "Method and apparatus for measur... Read More

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