US Patent Issued to TOKYO SEIMITSU on June 16 for "Adjustment method for shape measuring device" (Japanese Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,656,100, issued on June 16, was assigned to TOKYO SEIMITSU Co. LTD. (Tokyo).

"Adjustment method for shape measuring device" was invented by Yoshiyuki Kawata (Tsuchiura-city, Japan), Katsufumi Moriyama (Tsuchiura-city, Japan) and Hideki Morii (Tsuchiura-city, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An adjustment method for a shape measuring device that radiates light from a light source to a master for adjustment and a reference surface respectively as measurement light and reference light and measures a shape of a surface to be measured of a measurement target using multiplexed light of the measurement light and the reference light respecti...