ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,753, issued on July 7, was assigned to Mainline Scientific LLC (Malvern, Pa.). "Sample holder for surface plasmon resonance and plasmon-wave... Read More
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,754, issued on July 7, was assigned to MET Co. Ltd. (Seoul, South Korea). "Method for detecting target biomolecule in biological sample, dis... Read More
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,755, issued on July 7, was assigned to Asahi Kasei Microdevices Corp. (Tokyo). "Optical density measuring apparatus" was invented by Takaaki... Read More
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,756, issued on July 7, was assigned to ATOMIC ENERGY OF CANADA Ltd./ENERGIE ATOMIQUE DU CANADA LIMITEE. "Method and apparatus for detecting ... Read More
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,757, issued on July 7, was assigned to Corrosion Innovations LLC (Houston). "Method of preparing surfaces comprising inspecting surface" was... Read More
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,758, issued on July 7, was assigned to EUROIMMUN Medizinische Labordiagnostika AG (Lubeck, Germany). "Method and device for detecting at lea... Read More
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,759, issued on July 7, was assigned to Canon K.K. (Tokyo). "Processing apparatus, processing system, processing method, and storage medium" ... Read More
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,760, issued on July 7, was assigned to LASERTEC Corp. (Yokohama, Japan). "Optical apparatus and focus correction method" was invented by Min... Read More
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,761, issued on July 7, was assigned to PlayNitride Display Co. Ltd. (MiaoLi County, Taiwan). "Defect detection and removal apparatus and met... Read More
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,762, issued on July 7, was assigned to MICROTEC S.p.A. (Bressanone, Italy). "Modular apparatus for the inspection of industrial products and... Read More