US Patent Issued to ZTE on May 12 for "Methods, devices, and systems for configuring UE with quality indication for minimization of drive test" (Chinese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,628,023, issued on May 12, was assigned to ZTE Corp. (Shenzhen, China).

"Methods, devices, and systems for configuring UE with quality indication for minimization of drive test" was invented by Yan Xue (Shenzhen, China), Feng Xie (Shenzhen, China) and Li Yang (Shenzhen, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure describes methods, system, and devices for configuring a user equipment (UE) with quality information for minimization of drive test (MDT). One method includes sending, by the RAN node, a configuration message to the UE, the configuration message comprising the quality information, so that the UE performs an MDT t...