US Patent Issued to ZTE on March 3 for "Measurement method and apparatus, node, and storage medium" (Chinese Inventors)

ALEXANDRIA, Va., March 3 -- United States Patent no. 12,568,389, issued on March 3, was assigned to ZTE Corp. (Shenzhen, China).

"Measurement method and apparatus, node, and storage medium" was invented by Li Niu (Shenzhen, China) and Bo Dai (Shenzhen, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed herein are a measurement method and apparatus, a node, and a non-transitory computer-readable storage medium. The measurement method may include: acquiring, by a first communication node, measurement information configured by a second communication node; performing, by the first communication node, measurement according to the measurement information to obtain a measurement result; and reporting, b...