US Patent Issued to ZTE on June 30 for "Determining a beam failure event for a cell according to channel qualities" (Chinese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,671,487, issued on June 30, was assigned to ZTE Corp. (Shenzhen, China).

"Determining a beam failure event for a cell according to channel qualities" was invented by Bo Gao (Shenzhen, China), Zhaohua Lu (Shenzhen, China), Yu Ngok Li (Shenzhen, China), Fei Dong (Shenzhen, China) and Xianghui Han (Shenzhen, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "This disclosure relates to wireless radio link recovery methods. In various implementations, the method includes determining a beam failure event for a first cell, and transmitting a beam recovery request message on a shared uplink channel when available. In other implementations, the method includes...