US Patent Issued to ZTE on June 23 for "Large-scale characteristic parameter measurement method and apparatus, and node and storage medium" (Chinese Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,666,288, issued on June 23, was assigned to ZTE Corp. (Guangdong, China).

"Large-scale characteristic parameter measurement method and apparatus, and node and storage medium" was invented by Xinquan Ye (Guangdong, China), Shujuan Zhang (Guangdong, China), Yijian Chen (Guangdong, China), Guanghui Yu (Guangdong, China) and Zhaohua Lu (Guangdong, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are a large-scale property parameter measurement method and apparatus, a node and a storage medium. The large-scale property parameter measurement method includes acquiring indication information which includes quasi co-location (QCL) association inform...