US Patent Issued to Zscaler on April 14 for "Learning from mistakes to improve detection rates of machine learning (ML) models" (American, Indian Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,450, issued on April 14, was assigned to Zscaler Inc. (San Jose, Calif.).

"Learning from mistakes to improve detection rates of machine learning (ML) models" was invented by Dianhuan Lin (Sunnyvale, Calif.), Miao Zhang (Palo Alto, Calif.), Shaleen Taneja (Faridabad, India), Rex Shang (Los Altos, Calif.) and Howie Xu (Palo Alto, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods for learning from mistakes to improve detection rates of Machine Learning (ML) models. The systems and methods including receiving data with labels; running the data through a trained ML model for predictions; identifying errors in the predictions base...