US Patent Issued to ZIEN on March 24 for "System and method for analyzing contamination paths to analyze vulnerabilities in IoT devices" (South Korean Inventor)

ALEXANDRIA, Va., March 24 -- United States Patent no. 12,585,787, issued on March 24, was assigned to ZIEN INC. (Seoul, South Korea).

"System and method for analyzing contamination paths to analyze vulnerabilities in IoT devices" was invented by Young Min Cho (Incheon, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are a method and a system for analyzing a vulnerability in software installed on an Internet of things (IoT) device. In the vulnerability analysis method and the device, a target binary file extracted from firmware of the IoT device is acquired, a taint path is generated by performing taint analysis on the target binary file, transmission information related to the taint path ...