ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,002, issued on May 12, was assigned to ZHEJIANG PIXFRA TECHNOLOGY Co. LTD. (Hangzhou, China).
"Systems and methods for temperature measurement" was invented by Zhiqiang Yang (Hangzhou, China), Wuping Lu (Hangzhou, China), Tao Lou (Hangzhou, China), Diquan Xu (Hangzhou, China) and Jie Zhan (Hangzhou, China).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides a system and method for temperature measurement. The method may include obtaining a thermal image of an object acquired by a thermal imaging device; identifying, in the thermal image, a first portion of the thermal image corresponding to a first target region of the objec...