US Patent Issued to YOKOWO on July 28 for "Probe" (Japanese Inventor)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,310, issued on July 28, was assigned to YOKOWO Co. LTD. (Tokyo).

"Probe" was invented by Kenichi Sato (Tomioka, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A probe includes greater than or equal to 15 mass % and less than or equal to 60 mass % of Pd, greater than or equal to 3 mass % and less than or equal to 79.9 mass % of Cu, and greater than or equal to 0.1 mass % and less than or equal to 75 mass % of at least one of Ni and Pt."

The patent was filed on March 18, 2022, under Application No. 18/284,072.

*For further information, including images, charts and tables, please visit: http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO2&Sect2...