US Patent Issued to Yokogawa Electric on Nov. 3 for "Surface scatter turbidimeter and turbidity measurement method" (Japanese Inventor)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,279, issued on Nov. 3, was assigned to Yokogawa Electric Corp. (Tokyo).

"Surface scatter turbidimeter and turbidity measurement method" was invented by Nanami Yamashita (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement tank stores a liquid to be measured. A light source emits light to a liquid surface of the liquid to be measured stored in the measurement tank. A light receiving element receives scattered light generated at the measurement tank from the light from the light source. A change mechanism changes a relative position in relation to a component horizontal to the liquid surface in a direction of travel of the light, the rel...