US Patent Issued to Yokogawa Electric, Yokogawa Test & Measurement on May 19 for "Measurement apparatus and measurement method" (Japanese Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,673, issued on May 19, was assigned to Yokogawa Electric Corp. (Tokyo) and Yokogawa Test & Measurement Corp. (Tokyo).

"Measurement apparatus and measurement method" was invented by Kenji Murakami (Hachioji, Japan) and Naoki Ito (Hachioji, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement apparatus includes a controller configured to inject an injection current with a second frequency through an insulator into the core wire, to which the voltage to be measured, with a first frequency, is applied, acquire a composite current in which the injection current and a leakage current of the voltage to be measured having leaked out of the core...