ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,816, issued on Sept. 22, was assigned to YISHI INDUSTRIAL Co. LTD (Miaoli County, Taiwan).
"Test environment control system" was invented by Wen-Hsin Lee (Hsinchu County, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A test environment control system includes a pressure-resistant container, a temperature control device that is at least partially arranged in the pressure-resistant container, and a plurality of contactless test devices that are connected to the pressure-resistant container. The pressure-resistant container is configured to store a dry gas therein that has a dew point temperature less than -10deg C. and that has more than 1 at...