US Patent Issued to YEDA RESEARCH AND DEVELOPMENT on Sept. 8 for "System and method for extraction of structural data of a sample from scan data" (Israeli Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,080, issued on Sept. 8, was assigned to YEDA RESEARCH AND DEVELOPMENT Co. LTD. (Rehovot, Israel).

"System and method for extraction of structural data of a sample from scan data" was invented by Michael Elbaum (Tel-Aviv, Israel), Shahar Seifer (Rehovot, Israel) and Lothar Houben (Rehovot, Israel).

According to the abstract* released by the U.S. Patent & Trademark Office: "Some embodiments relate to a computer system for determining a structural image of a sample. The computer system is configured to receive and process raw measured data produced by a scanning microscope and being indicative of at least one scan dataset (IM)N acquired in a scan session and corresponding to a seque...