US Patent Issued to YAMAHA HATSUDOKI on Dec. 2 for "Measurement device and board inspection device" (Japanese Inventors)

ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,487,079, issued on Dec. 2, was assigned to YAMAHA HATSUDOKI K.K. (Iwata, Japan).

"Measurement device and board inspection device" was invented by Takahiro Matsukubo (Iwata, Japan) and Takeshi Arai (Iwata, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement device includes an imager, a first projector to project a linear first measurement light beam onto a measurement target from a direction inclined at a first angle, and a second projector to project a linear second measurement light beam onto the measurement target from a direction inclined at a second angle. The measurement device further includes a controller configured or programmed to...