US Patent Issued to YAMAHA FINE TECHNOLOGIES on May 5 for "Chamber, lid, and leak tester" (Japanese Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,741, issued on May 5, was assigned to YAMAHA FINE TECHNOLOGIES Co. LTD. (Hamamatsu, Japan).

"Chamber, lid, and leak tester" was invented by Toru Ishii (Hamamatsu, Japan), Minoru Yamamoto (Fukuroi, Japan), Daisuke Homma (Hamamatsu, Japan) and Kosei Fujita (Hamamatsu, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An object of the present invention is to provide a chamber in which workpieces of different sizes can be positioned. A chamber according to an aspect of the present invention is a chamber for a leak tester, the chamber housing in the interior thereof a workpiece having an opening, the chamber including: a first member having a recess tha...