US Patent Issued to XILINX on Sept. 9 for "Method and system for mitigating hot carrier injection effect in a semiconductor circuit" (Indian Inventors)

ALEXANDRIA, Va., Sept. 10 -- United States Patent no. 12,413,227, issued on Sept. 9, was assigned to XILINX INC. (San Jose, Calif.).

"Method and system for mitigating hot carrier injection effect in a semiconductor circuit" was invented by Sasi Rama Subrahmanyam Lanka (Challapalli, India), Hari Bilash Dubey (Hyderabad, India) and Vss Prasad Babu Akurathi (Hyderbad, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "The Hot Carrier Injection effect is a phenomenon present in semiconductor devices, where charges are trapped in the gate oxide region and degrade the device. Hot carrier Injection (HCI) is one of the major problems in lower voltage technologies due to lower voltage tolerance limits of MOS device...