ALEXANDRIA, Va., May 5 -- United States Patent no. 12,619,809, issued on May 5, was assigned to XILINX INC. (San Jose, Calif.).
"Method for fault detection in safety mechanisms" was invented by Federico Venini (San Jose, Calif.) and David Tran (San Jose, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Safety mechanisms are embedded into a System on a Chip (SoC) and are operable to detect faults present in the logic circuitry in the SoC. Various types of faults in logic circuitry can occur, for example, a bit stuck at 0 or 1, or a transient or temporary fault due to radiation impacting the SoC. SoC devices are required to meet certain automotive safety integrity standards. The most stringent automotive ...