US Patent Issued to XIAMEN INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE on Sept. 15 for "Chip testing method and apparatus" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,583, issued on Sept. 15, was assigned to XIAMEN INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE Co. LTD. (Xiamen, China).

"Chip testing method and apparatus" was invented by Yonghong Huang (Xiamen, China), Juilung Chen (Xiamen, China), Yongbo Liu (Xiamen, China), Huayi Liu (Xiamen, China) and Wenjie Su (Xiamen, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A chip testing method and apparatus are provided, and the method includes: providing a plurality of chips, each of the chips including an input pin, an output pin, and a state machine circuit; connecting the input pin of each of the chips to a same input start module which outputs a start signal ...