ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,855, issued on Aug. 25, was assigned to XENOCS SAS (Grenoble, France).
"X-ray scattering apparatus and x-ray scattering method" was invented by Peter Hoghoj (Grenoble, France), Karsten Joensen (Grenoble, France) and Pierre Panine (Grenoble, France).
According to the abstract* released by the U.S. Patent & Trademark Office: "An X-ray scattering apparatus has a sample vacuum chamber, a sample holder placed inside the sample vacuum chamber for aligning and/or orienting a sample to be analyzed by X-ray scattering, an X-ray beam delivery system having a 2D X-ray source and a 2D monochromator and being arranged upstream of the sample holder for generating and directing an X-ray beam al...