ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,769,736, issued on Oct. 20, was assigned to X Development LLC (Mountain View, Calif.).
"Characterization of machine-learning models" was invented by John William K. Kirchenbauer (Arlington, Va.), David Andre (San Francisco) and Garrett Raymond Honke (Mountain View, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed herein are systems and methods for objectively characterizing machine-learning models including receiving first training data formatted to be used in the training of a machine-learning model; receiving one or more challenge queries formatted to be run on the machine-learning model; generating, for the first training data, a plura...