US Patent Issued to WUYI UNIVERSITY on Nov. 3 for "Ultrafast diffraction imaging system and method, and storage medium" (Chinese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,278, issued on Nov. 3, was assigned to WUYI UNIVERSITY (Jiangmen, China).

"Ultrafast diffraction imaging system and method, and storage medium" was invented by Jiale Long (Jiangmen, China), Jiangtao Xi (Jiangmen, China), Kesen Huang (Jiangmen, China), Jianmin Zhang (Jiangmen, China), Chuisong Meng (Jiangmen, China), Zhao Ma (Jiangmen, China), Yingrong Li (Jiangmen, China), Jian Pan (Jiangmen, China), Jiekai Zhuo (Jiangmen, China), Haoming Huang (Jiangmen, China) and Zaiming Li (Jiangmen, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "An ultrafast diffraction imaging system and method, and a storage medium are disclosed. The ultrafast diffractio...