US Patent Issued to WIPRO on Nov. 3 for "Method and system for assessing internal defects of a material" (Indian Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,319, issued on Nov. 3, was assigned to WIPRO Ltd. (Bangalore, India).

"Method and system for assessing internal defects of a material" was invented by Akilan Baskar (Chennai, India) and Sujatha Jagannath (Bangalore, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed herein is a method and system for assessing one or more defects in a material. The method comprises extracting one or more assessment parameters from ultrasound waves propagated through a cross-section of the material. Further, the method identifies presence of one or more defects in the material by analyzing the one or more assessment parameters using a first machine learning...