ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,777,896, issued on Oct. 27, was assigned to Winbond Electronics Corp. (Taichung City, Taiwan).
"Method for detecting seam in film" was invented by Chih-Yu Chiang (Taichung City, Taiwan) and Chi-Hung Chan (Taichung City, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method for detecting a seam in a film is provided. The following process is performed on a film in a first wafer: (a) a scan is performed to obtain a gray level image; (b) a region positioning process is performed on the gray level image to define target regions and a seam region located in each target region; (c) a gray level value of each pixel in each seam region is obtained, and...