US Patent Issued to Winbond Electronics on July 14 for "Method for determining memory stability and testing coverage" (Taiwanese Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,971, issued on July 14, was assigned to Winbond Electronics Corp. (Taichung City, Taiwan).

"Method for determining memory stability and testing coverage" was invented by Shih-Hung Chen (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed is a method for determining a memory stability and a testing coverage. The method includes: providing multiple testing programs, for testing each memory die by using one of the testing programs to generate a failure bit information of each memory die; acquiring the failure bit information of each memory die tested with the each testing program; acquiring a failure bit address information of each...