US Patent Issued to Winbond Electronics on Feb. 24 for "Automatic functional test pattern generation based on DUT reference model and unique scripts" (Israeli Inventors)

ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,561,218, issued on Feb. 24, was assigned to Winbond Electronics Corp. (Taichung, Taiwan).

"Automatic functional test pattern generation based on DUT reference model and unique scripts" was invented by Tal Klein (Kfar Saba, Israel), Ronny Aboutboul (Zikhron Yaakov, Israel), Yoram Avigdor (Kfar Saba, Israel) and Erez Glasberg (Herzliya, Israel).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus for generating Automatic Test Equipment (ATE) testing patterns to test an electronic device-under-test (DUT) that includes electrical circuitry, at least one input port and at least one output port. The apparatus includes a memory and a processor. The memor...