US Patent Issued to Wavescan Technologies on May 19 for "Non-contact microwave testing system and method for see-through imaging" (Singaporean Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,746, issued on May 19, was assigned to Wavescan Technologies PTE. LTD. (Singapore).

"Non-contact microwave testing system and method for see-through imaging" was invented by Kush Agarwal (Singapore) and Karthik Thothathri (Singapore).

According to the abstract* released by the U.S. Patent & Trademark Office: "The invention describes a non-contact system and a method for a microwave-based imaging solution for non-destructive testing (NDT) and evaluation of an area under testing (AUT) of assets such as facades, cladding systems, concrete pillars, concrete walls, bridges, tunnels, and dams. The system is comprised of a combination of a various subsystems including but not exclusive t...