ALEXANDRIA, Va., July 21 -- United States Patent no. 12,685,498, issued on July 21, was assigned to VIKEN DETECTION Corp. (Burlington, Mass.).

"X-ray detection structure and system" was invented by Peter J. Rothschild (Newton, Mass.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system for detecting a scanning beam of x-rays includes one or more scintillator volumes oriented along an x-ray scan axis. The scintillator volume(s) receive x-rays transmitted through a target and produce scintillation photons responsively. Two or more ribbons of wavelength-shifting fibers (WSFs) are optically coupled to the scintillator volume(s) along the axis via a spatial periodic adjacency of the ribbons to the axis. The rib...