ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,755,168, issued on Oct. 6, was assigned to VIAVI Solutions Inc. (Chandler, Ariz.).
"Endpoint detection in manufacturing process by near infrared spectroscopy and machine learning techniques" was invented by Changmeng Hsiung (Redwood City, Calif.), Peng Zou (Ridgefield, Conn.) and Lan Sun (Santa Rosa, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A device may receive training spectral data associated with a manufacturing process that transitions from an unsteady state to a steady state. The device may generate, based on the training spectral data, a plurality of iterations of a support vector machine (SVM) classification model. The device may dete...