US Patent Issued to VIAVI SOLUTIONS on May 19 for "Test device for measuring synchronization errors between clusters in a cellular network" (South Korean Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,634,848, issued on May 19, was assigned to VIAVI SOLUTIONS INC. (Chandler, Ariz.).

"Test device for measuring synchronization errors between clusters in a cellular network" was invented by Jong-Min Kim (Seoul, South Korea), Young-Kill Kim (Seoul, South Korea), Hyuck-In Kwon (Seoul, South Korea), Yoo-Chul Shin (Seoul, South Korea) and Jae-Gab Lee (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test device may be a portable test device that can perform over the air measurements to determine synchronization errors between clusters in a cellular network. The test device can generate a graphical user interface that can show a map of the b...