ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,699,148, issued on Aug. 4, was assigned to VERKOR (Grenoble, France).
"Apparatus and method for inspecting a secondary cell" was invented by Delphine Vidal (Grenoble, France), Drew Heilman (Grenoble, France) and Jeong Hyun Kim (Grenoble, France).
According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection apparatus for inspecting at least one secondary cell includes a fixed support part; a movable part; pressing parts that are installed between the support part and the movable part and are freely movable along the main axis, two adjacent pressing parts defining a space for accommodating a secondary cell; and each of the pressing parts has a heat plate con...