US Patent Issued to University of Science and Technology of China on March 17 for "Method for storing and acquiring information using fluorescence defects in wide bandgap materials" (Chinese Inventors)

ALEXANDRIA, Va., March 17 -- United States Patent no. 12,579,998, issued on March 17, was assigned to University of Science and Technology of China (Hefei, China).

"Method for storing and acquiring information using fluorescence defects in wide bandgap materials" was invented by Jingyang Zhou (Hefei, China), Kangwei Xia (Hefei, China), Ya Wang (Hefei, China) and Jiangfeng Du (Hefei, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for storing and acquiring information using fluorescence defects in wide bandgap materials, a device, an apparatus and a storage medium are provided, which are applied to a field of optical information storage technology. The method includes: determining a processing p...