US Patent Issued to UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA on April 21 for "Random transient power test signal generator based on three-dimensional memristive discrete map" (Chinese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,700, issued on April 21, was assigned to UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA (Chengdu, China).

"Random transient power test signal generator based on three-dimensional memristive discrete map" was invented by Bo Xu (Chengdu, China), Yuhua Cheng (Chengdu, China), Kai Chen (Chengdu, China), Jia Zhao (Chengdu, China), Hang Geng (Chengdu, China) and Yifan Wang (Chengdu, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A random transient power test signal generator based on three-dimensional memristive discrete map, which utilizes a three-dimensional parallel bi-memristor Logistic map module to generate two pseudo-random sequenc...