ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,546,982, issued on Feb. 10, was assigned to UNIVERSITE DE BORDEAUX (Bordeaux, France) and CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (Paris).

"Augmented-field-of-view, high-resolution optical microscopy method and optical microscope" was invented by Amaury Badon (Merignac, France), Gaelle Recher (Talence, France) and Pierre Nassoy (Bordeaux, France).

According to the abstract* released by the U.S. Patent & Trademark Office: "The invention relates to an optical microscope (100) and a microscopy method. According to the invention, the microscope comprises an imaging module (200) comprising an optical beam splitter (40), a first optical system (41, 42, 43), a first camera (51), a seco...