US Patent Issued to United States of America, as represented by the Secretary of the Navy on Aug. 26 for "Independent bit error rate test device" (Virginia, Ohio Inventors)

ALEXANDRIA, Va., Aug. 26 -- United States Patent no. 12,401,465, issued on Aug. 26, was assigned to United States of America, as represented by the Secretary of the Navy (Arlington, Va.).

"Independent bit error rate test device" was invented by David M. Maciupa (Dayton, Ohio) and Jonathan D. P. Ousley (Fredericksburg, Va.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An electronic device is provided for conducting an independent bit error rate (BER) test to measure signal noise from a communication system that receives a radio frequency (RF) signal through a power combiner. The device includes a demodulator, a test bit pattern generator, a bit pattern comparator, a modulator and a computation processor. The...