US Patent Issued to United Semiconductor (Xiamen) on Feb. 17 for "Semiconductor test key including strip arranged resistor patterns" (Chinese, Taiwanese Inventors)

ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,557,606, issued on Feb. 17, was assigned to United Semiconductor (Xiamen) Co. Ltd. (Fujian, China).

"Semiconductor test key including strip arranged resistor patterns" was invented by Linshan Yuan (Fujian, China), Yi Lu Dai (Shamen, China), Guang Yang (Fujian, China), Jinjian Ouyang (Fujian, China), Hang Liu (Shamen, China), Chin-Chun Huang (Hsinchu County, Taiwan) and Wen Yi Tan (Fujian, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "The invention provides a semiconductor testkey, which includes a testkey on a substrate, the testkey includes a first resistor pattern, a second resistor pattern and a third resistor pattern arranged in a strip, the ...