US Patent Issued to United Semiconductor (Xiamen) on Aug. 4 for "Semiconductor test key structure and test method of semiconductor structure" (Taiwanese, Chinese Inventors)

ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,699,126, issued on Aug. 4, was assigned to United Semiconductor (Xiamen) Co. Ltd. (Xiamen, China).

"Semiconductor test key structure and test method of semiconductor structure" was invented by Ya Xuan Zhuang (Shamen City, China), Wei-Chun Chang (Taichung City, Taiwan), You-Di Jhang (New Taipei City, Taiwan), Chin-Chun Huang (Hsinchu County, Taiwan) and Wen Yi Tan (Xiamen, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "The invention provides a semiconductor test key structure, which comprises a substrate, a plurality of gate structures located on the substrate, a plurality of thin film resistor layers, wherein each thin film resistor layer is locate...