US Patent Issued to UIF (UNIVERSITY INDUSTRY FOUNDATION), YONSEI UNIVERSITY on June 30 for "Non-linear memory failure analysis method and memory test apparatus" (South Korean Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,965, issued on June 30, was assigned to UIF (UNIVERSITY INDUSTRY FOUNDATION), YONSEI UNIVERSITY (Seoul, South Korea).

"Non-linear memory failure analysis method and memory test apparatus" was invented by Sungho Kang (Seoul, South Korea) and Ha Young Lee (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present embodiment relates to a memory failure analysis method that is performed by a memory test apparatus. The memory failure analysis method includes setting a test area of a memory under test (MUT), inputting a test pattern to the set test area, receiving a test result from the MUT, and an updating operation including operatio...