US Patent Issued to UIF (UNIVERSITY-INDUSTRY FOUNDATION), YONSEI UNIVERSITY, SAMSUNG ELECTRONICS on March 17 for "Processor and method of detecting soft error from processor" (South Korean Inventors)

ALEXANDRIA, Va., March 17 -- United States Patent no. 12,579,016, issued on March 17, was assigned to UIF (UNIVERSITY-INDUSTRY FOUNDATION), YONSEI UNIVERSITY (Seoul, South Korea) and SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).

"Processor and method of detecting soft error from processor" was invented by Taesun Kim (Suwon-si, South Korea), Jinhong Park (Suwon-si, South Korea), Hwisoo So (Seoul, South Korea), Kyoungwoo Lee (Seoul, South Korea) and Jinhyo Jung (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A processor includes an instruction pipeline that sequentially processes an original instruction and a duplicate instruction, which is generated by duplicating the original instr...